Browsing by Author "Ozturk, Aydin"

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    Article
    Citation - WoS: 3
    Citation - Scopus: 5
    A copula-based BRDF model
    (Blackwell Publishing Ltd, 2010) Aydin Öztürk; Murat Kurt; Ahmet Bilgili; Kurt, Murat; Bilgili, Ahmet; Ozturk, Aydin
    In this paper we introduce a novel approach for modeling surface reflection. We focus on using a family of probability distributions called Archimedean copulas as BRDF models. The Archimedean representation has an attractive property in that the multivariate distributions are characterized by their marginal distributions through a single univariate function only. It is shown that the proposed model meets the reciprocity property of reflection. Based on measured BRDF data we demonstrate that the proposed approach provides a good approximation to BRDF. Empirical comparisons are made with some classically used BRDF models. © 2010 The Eurographics Association and Blackwell Publishing Ltd. © 2018 Elsevier B.V. All rights reserved.
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    Citation - WoS: 5
    Citation - Scopus: 8
    BRDF reconstruction using compressive sensing
    (Union Agency Science Press, 2013) Nurcan Seylan; Serkan Ergun; Aydin Öztürk; Seylan, Nurcan; Ergun, Serkan; Ozturk, Aydin
    Compressive sensing is a technique for efficiently acquiring and reconstructing the data. This technique takes advantage of sparseness or compressibility of the data allowing the entire measured data to be recovered from relatively few measurements. Considering the fact that the BRDF data often can be highly sparse we propose to employ the compressive sensing technique for an efficient reconstruction. We demonstrate how to use compressive sensing technique to facilitate a fast procedure for reconstruction of large BRDF data. We have showed that the proposed technique can also be used for the data sets having some missing measurements. Using BRDF measurements of various isotropic materials we obtained high quality images at very low sampling rates both for diffuse and glossy materials. Similar results also have been obtained for the specular materials at slightly higher sampling rates. © 2013 Elsevier B.V. All rights reserved.