Exploiting model morphology for event-based testing

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Date

2015

Authors

Fevzi Belli
Mutlu Beyazit

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers Inc.

Open Access Color

BRONZE

Green Open Access

Yes

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No
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Top 10%
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Average
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Average

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Abstract

Model-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models called mutants by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k ≥ 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars related mutation operators and algorithms to generate test cases enabling the following: (1) the exclusion of equivalent mutants and multiple mutants, (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model, (3) the analysis of morphologically different models enabling the systematic generation of mutants thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach. © 2015 Elsevier B.V. All rights reserved.

Description

Keywords

Grammar-based Testing, Model-based Mutation Testing, Mutant Selection, Computational Grammars, Model Checking, Morphology, Equivalent Mutants, Grammar-based Testing, Model Based Testing, Model-based Opc, Mutant Selection, Mutation Operators, Mutation Testing, Test Generations, Software Testing, Computational grammars, Model checking, Morphology, Equivalent Mutants, Grammar-based testing, Model based testing, Model-based OPC, mutant selection, Mutation operators, Mutation testing, Test generations, Software testing, Grammar-based testing, Model based testing, Computational grammars, Mutant selection, Software testing

Fields of Science

0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology

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OpenCitations Citation Count
8

Source

IEEE Transactions on Software Engineering

Volume

41

Issue

Start Page

113

End Page

134
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CrossRef : 8

Scopus : 11

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Mendeley Readers : 28

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