Featured Event Sequence Graphs for Model-Based Incremental Testing of Software Product Lines

dc.contributor.author Tugkan Tuglular
dc.contributor.author Mutlu Beyazit
dc.contributor.author Dilek Ozturk
dc.contributor.author Beyazit, Mutlu
dc.contributor.author Tuglular, Tugkan
dc.contributor.author Ozturk, Dilek
dc.contributor.editor V Getov
dc.contributor.editor JL Gaudiot
dc.contributor.editor N Yamai
dc.contributor.editor S Cimato
dc.contributor.editor M Chang
dc.contributor.editor Y Teranishi
dc.contributor.editor JJ Yang
dc.contributor.editor HV Leong
dc.contributor.editor H Shahriar
dc.contributor.editor M Takemoto
dc.contributor.editor D Towey
dc.contributor.editor H Takakura
dc.contributor.editor A Elci
dc.contributor.editor Susumu
dc.contributor.editor S Puri
dc.coverage.spatial 43rd IEEE-Computer-Society Annual International Computers Software and Applications Conference (COMPSAC)
dc.date.accessioned 2025-10-06T16:21:25Z
dc.date.issued 2019
dc.description.abstract The goal of software product lines (SPLs) is rapid development of high-quality software products in a specific domain with cost minimization. To assure quality of software products from SPLs products need to be tested systematically. However testing every product variant in isolation is generally not feasible for large number of product variants. An approach to deal with this issue is to use incremental testing where test artifacts that are developed for one product are reused for another product which can be obtained by incrementally adding features to the prior product. We propose a novel model-based test generation approach for products developed using SPL that follows incremental testing paradigm. First we introduce Featured Event Sequence Graphs (FESGs) an extension of ESGs that provide necessary definitions and operations to support commonalities and variabilities in SPLs with respect to test models. Then we propose a test generation technique for the product variants of an SPL which starts from any product. The proposed technique with FESGs avoids redundant test generation for each product from SPL. We compare our technique with in-isolation testing approach by a case study.
dc.description.sponsorship This research is supported by The Scientific and Technological Research Council of Turkey (TUBITAK) under the grant 117E884.
dc.description.sponsorship Scientific and Technological Research Council of Turkey (TUBITAK) [117E884]
dc.identifier.doi 10.1109/COMPSAC.2019.00035
dc.identifier.isbn 978-1-7281-2607-4
dc.identifier.isbn 9781728126074
dc.identifier.issn 0730-3157
dc.identifier.uri http://dx.doi.org/10.1109/COMPSAC.2019.00035
dc.identifier.uri https://gcris.yasar.edu.tr/handle/123456789/6856
dc.identifier.uri https://doi.org/10.1109/COMPSAC.2019.00035
dc.language.iso English
dc.publisher IEEE COMPUTER SOC
dc.relation.ispartof 43rd IEEE-Computer-Society Annual International Computers Software and Applications Conference (COMPSAC)
dc.relation.ispartofseries Proceedings International Computer Software and Applications Conference
dc.rights info:eu-repo/semantics/openAccess
dc.source 2019 IEEE 43RD ANNUAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE (COMPSAC) VOL 1
dc.subject software product lines, model-based testing, incremental testing, event sequence graphs
dc.subject CHECKING
dc.subject Software Product Lines
dc.subject Model-Based Testing
dc.subject Event Sequence Graphs
dc.subject Incremental Testing
dc.title Featured Event Sequence Graphs for Model-Based Incremental Testing of Software Product Lines
dc.type Conference Object
dspace.entity.type Publication
gdc.author.id Beyazıt, Mutlu/0000-0003-2714-8155
gdc.author.id Tuglular, Tugkan/0000-0001-6797-3913
gdc.author.id ÖZTÜRK KAYA, Dilek/0000-0003-3663-0533
gdc.author.wosid Tuglular, Tugkan/AAI-8008-2020
gdc.author.wosid Ozturk, Dilek/HKO-1868-2023
gdc.bip.impulseclass C5
gdc.bip.influenceclass C5
gdc.bip.popularityclass C4
gdc.coar.type text::conference output
gdc.collaboration.industrial false
gdc.description.department
gdc.description.departmenttemp [Tuglular, Tugkan; Ozturk, Dilek] Izmir Inst Technol, Dept Comp Engn, Izmir, Turkey; [Beyazit, Mutlu] Yasar Univ, Dept Comp Engn, Izmir, Turkey
gdc.description.endpage 202
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
gdc.description.startpage 197
gdc.description.woscitationindex Conference Proceedings Citation Index - Science
gdc.identifier.openalex W2957560894
gdc.identifier.wos WOS:000538791700025
gdc.index.type WoS
gdc.oaire.diamondjournal false
gdc.oaire.impulse 2.0
gdc.oaire.influence 2.65022E-9
gdc.oaire.isgreen true
gdc.oaire.keywords Incremental testing
gdc.oaire.keywords Event sequence graphs
gdc.oaire.keywords Software product lines
gdc.oaire.keywords Model-based testing
gdc.oaire.popularity 5.4470255E-9
gdc.oaire.publicfunded false
gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
gdc.openalex.collaboration National
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gdc.opencitations.count 6
gdc.plumx.crossrefcites 1
gdc.plumx.mendeley 8
gdc.plumx.scopuscites 5
gdc.virtual.author Beyazit, Mutlu
gdc.wos.citedcount 5
oaire.citation.endPage 202
oaire.citation.startPage 197
person.identifier.orcid Tuglular- Tugkan/0000-0001-6797-3913, Beyazit- Mutlu/0000-0003-2714-8155, OZTURK KAYA- Dilek/0000-0003-3663-0533
project.funder.name Scientific and Technological Research Council of Turkey (TUBITAK) [117E884]
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