Incremental Testing in Software Product Lines-An Event Based Approach

dc.contributor.author Mutlu Beyazit
dc.contributor.author Tugkan Tuglular
dc.contributor.author Dilek Ozturk Kaya
dc.contributor.author Beyazit, Mutlu
dc.contributor.author Tuglular, Tugkan
dc.contributor.author Kaya, Dilek Ozturk
dc.date.accessioned 2025-10-06T16:21:47Z
dc.date.issued 2023
dc.description.abstract One way of developing fast effective and high-quality software products is to reuse previously developed software components and products. In the case of a product family the software product line (SPL) approach can make reuse more effective. The goal of SPLs is faster development of low-cost and high-quality software products. This paper proposes an incremental model-based approach to test products in SPLs. The proposed approach utilizes event-based behavioral models of the SPL features. It reuses existing event-based feature models and event-based product models along with their test cases to generate test cases for each new product developed by adding a new feature to an existing product. Newly introduced featured event sequence graphs (FESGs) are used for behavioral feature and product modeling, thus generated test cases are event sequences. The paper presents evaluations with three software product lines to validate the approach and analyze its characteristics by comparing it to the state-of-the-art ESG-based testing approach. Results show that the proposed incremental testing approach highly reuses the existing test sets as intended. Also it is superior to the state-of-the-art approach in terms of fault detection effectiveness and test generation effort but inferior in terms of test set size and test execution effort.
dc.description.sponsorship This work was supported by the Scientific and Technological Research Council of Turkiye (TUBITAK) under Grant 117E884.
dc.description.sponsorship Scientific and Technological Research Council of Turkiye (TUBITAK) [117E884]
dc.identifier.doi 10.1109/ACCESS.2023.3234186
dc.identifier.issn 2169-3536
dc.identifier.scopus 2-s2.0-85147230304
dc.identifier.uri http://dx.doi.org/10.1109/ACCESS.2023.3234186
dc.identifier.uri https://gcris.yasar.edu.tr/handle/123456789/7025
dc.identifier.uri https://doi.org/10.1109/ACCESS.2023.3234186
dc.language.iso English
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.relation.ispartof IEEE Access
dc.rights info:eu-repo/semantics/openAccess
dc.source IEEE ACCESS
dc.subject Test pattern generators, Software product lines, Software testing, Behavioral sciences, Computational modeling, Time complexity, Incremental testing, model-based testing, software product line
dc.subject TEST-GENERATION, MODEL, TOOL
dc.subject Software Product Lines
dc.subject Software Product Line
dc.subject Software Testing
dc.subject Behavioral Sciences
dc.subject Incremental Testing
dc.subject Model-Based Testing
dc.subject Test Pattern Generators
dc.subject Time Complexity
dc.subject Computational Modeling
dc.title Incremental Testing in Software Product Lines-An Event Based Approach
dc.type Article
dspace.entity.type Publication
gdc.author.id Beyazıt, Mutlu/0000-0003-2714-8155
gdc.author.id Tuglular, Tugkan/0000-0001-6797-3913
gdc.author.scopusid 36182172500
gdc.author.scopusid 14627984700
gdc.author.scopusid 57203937473
gdc.author.wosid Tuglular, Tugkan/AAI-8008-2020
gdc.bip.impulseclass C5
gdc.bip.influenceclass C5
gdc.bip.popularityclass C4
gdc.coar.type text::journal::journal article
gdc.collaboration.industrial false
gdc.description.department
gdc.description.departmenttemp [Beyazit, Mutlu] Yasar Univ, Fac Engn, Dept Comp Engn, TR-35100 Izmir, Turkiye; [Tuglular, Tugkan; Kaya, Dilek Ozturk] Izmir Inst Technol, Fac Engn, Dept Comp Engn, TR-35430 Izmir, Turkiye
gdc.description.endpage 2395
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
gdc.description.startpage 2384
gdc.description.volume 11
gdc.description.woscitationindex Science Citation Index Expanded
gdc.identifier.openalex W4313546810
gdc.identifier.wos WOS:000912456400001
gdc.index.type WoS
gdc.index.type Scopus
gdc.oaire.accesstype GOLD
gdc.oaire.diamondjournal false
gdc.oaire.impulse 3.0
gdc.oaire.influence 2.5997047E-9
gdc.oaire.isgreen true
gdc.oaire.popularity 4.131908E-9
gdc.oaire.publicfunded false
gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
gdc.openalex.collaboration National
gdc.openalex.fwci 1.3001
gdc.openalex.normalizedpercentile 0.86
gdc.opencitations.count 4
gdc.plumx.crossrefcites 1
gdc.plumx.mendeley 25
gdc.plumx.scopuscites 6
gdc.scopus.citedcount 6
gdc.virtual.author Beyazit, Mutlu
gdc.wos.citedcount 3
oaire.citation.endPage 2395
oaire.citation.startPage 2384
person.identifier.orcid Beyazit- Mutlu/0000-0003-2714-8155, Tuglular- Tugkan/0000-0001-6797-3913,
project.funder.name Scientific and Technological Research Council of Turkiye (TUBITAK) [117E884]
publicationvolume.volumeNumber 11
relation.isAuthorOfPublication 64d31df7-fa77-4f4a-b085-f2d1cdc7443a
relation.isAuthorOfPublication.latestForDiscovery 64d31df7-fa77-4f4a-b085-f2d1cdc7443a
relation.isOrgUnitOfPublication ac5ddece-c76d-476d-ab30-e4d3029dee37
relation.isOrgUnitOfPublication.latestForDiscovery ac5ddece-c76d-476d-ab30-e4d3029dee37

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