Optimized Test Case Generation Based on Operational Profiles with Fault-Proneness Information

Abstract

In this paper a novel formal model called an OPFPI (operational profile with fault-proneness information) and a novel algorithm to generate optimized test cases from the OPFPI are proposed in order to effectively improve software reliability or gain a perspective of software reliability in a limited span of time for testing. The OPFPI includes the feasibility problem due to the use of guards (conditions to make specific state transitions feasible), therefore ant colony optimization is employed in the algorithm to generate test cases that cover frequent and fault-prone state transitions as comprehensively as possible. A test tool that implements the OPFPI and executes the optimized test case generation has been developed and it has been applied to a non-trivial system. The obtained results indicate that significant improvement of test cases can be achieved in a short time.