Exploiting Model Morphology for Event-Based Testing

dc.contributor.author Fevzi Belli
dc.contributor.author Mutlu Beyazit
dc.contributor.author Belli, Fevzi
dc.contributor.author Beyazit, Mutlu
dc.date FEB
dc.date.accessioned 2025-10-06T16:22:17Z
dc.date.issued 2015
dc.description.abstract Model-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models called mutants by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k >= 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars related mutation operators and algorithms to generate test cases enabling the following: (1) the exclusion of equivalent mutants and multiple mutants, (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model, (3) the analysis of morphologically different models enabling the systematic generation of mutants thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach.
dc.identifier.doi 10.1109/TSE.2014.2360690
dc.identifier.issn 0098-5589
dc.identifier.issn 1939-3520
dc.identifier.scopus 2-s2.0-84923068858
dc.identifier.uri http://dx.doi.org/10.1109/TSE.2014.2360690
dc.identifier.uri https://gcris.yasar.edu.tr/handle/123456789/7310
dc.identifier.uri https://doi.org/10.1109/TSE.2014.2360690
dc.language.iso English
dc.publisher IEEE COMPUTER SOC
dc.relation.ispartof IEEE Transactions on Software Engineering
dc.rights info:eu-repo/semantics/openAccess
dc.source IEEE TRANSACTIONS ON SOFTWARE ENGINEERING
dc.subject Model-based mutation testing, grammar-based testing, (model) morphology, mutant selection, test generation
dc.subject MUTATION, GENERATION
dc.subject Test Generation
dc.subject (Model) Morphology
dc.subject Mutant Selection
dc.subject Grammar-Based Testing
dc.subject Model-Based Mutation Testing
dc.title Exploiting Model Morphology for Event-Based Testing
dc.type Article
dspace.entity.type Publication
gdc.author.id Beyazıt, Mutlu/0000-0003-2714-8155
gdc.author.scopusid 57200611344
gdc.author.scopusid 36182172500
gdc.bip.impulseclass C4
gdc.bip.influenceclass C5
gdc.bip.popularityclass C5
gdc.coar.type text::journal::journal article
gdc.collaboration.industrial false
gdc.description.department
gdc.description.departmenttemp [Belli, Fevzi] Univ Paderborn, Dept Elect Engn & Informat Technol, D-33098 Paderborn, Germany; [Belli, Fevzi] Izmir Inst Technol, Dept Comp Engn, Izmir, Turkey; [Beyazit, Mutlu] Yasar Univ, Dept Comp Engn, Izmir, Turkey
gdc.description.endpage 134
gdc.description.issue 2
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
gdc.description.startpage 113
gdc.description.volume 41
gdc.description.woscitationindex Science Citation Index Expanded
gdc.identifier.openalex W2083820653
gdc.identifier.wos WOS:000351460400001
gdc.index.type WoS
gdc.index.type Scopus
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gdc.oaire.diamondjournal false
gdc.oaire.impulse 4.0
gdc.oaire.influence 2.7933291E-9
gdc.oaire.isgreen true
gdc.oaire.keywords Grammar-based testing
gdc.oaire.keywords Model based testing
gdc.oaire.keywords Computational grammars
gdc.oaire.keywords Mutant selection
gdc.oaire.keywords Software testing
gdc.oaire.popularity 2.9207288E-9
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
gdc.openalex.collaboration International
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gdc.opencitations.count 8
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gdc.virtual.author Beyazit, Mutlu
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person.identifier.orcid Beyazit- Mutlu/0000-0003-2714-8155
publicationissue.issueNumber 2
publicationvolume.volumeNumber 41
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