Beyazit, Mutlu

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Profile URL
https://gcris.yasar.edu.tr/handle/123456789/12695
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Job Title
Dr.Öğr.Üyesi
Email Address
Main Affiliation
01.01.09.01. Bilgisayar Mühendisliği Bölümü
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Former Staff
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Scopus Author ID
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WoS Researcher ID
CEW-8751-2022

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Documents

17

Citations

60

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Scholarly Output

4

Articles

3

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0/0

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0

Supervised PhD Theses

0

WoS Citation Count

16

Scopus Citation Count

21

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0

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0

WoS Citations per Publication

4.00

Scopus Citations per Publication

5.25

Open Access Source

3

Supervised Theses

0

JournalCount
12th International Conference on Software Engineering, Artificial Intelligence Research, Management and Applications (SERA) -- AUG 31-SEP 04, 2014 -- Kitakyushu, JAPAN1
43rd IEEE-Computer-Society Annual International Computers Software and Applications Conference (COMPSAC)1
IEEE Access1
IEEE Transactions on Software Engineering1
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Now showing 1 - 4 of 4
  • Thumbnail Image
    Article
    Citation - WoS: 3
    Citation - Scopus: 6
    Incremental Testing in Software Product Lines-An Event Based Approach
    (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2023) Mutlu Beyazit; Tugkan Tuglular; Dilek Ozturk Kaya; Beyazit, Mutlu; Tuglular, Tugkan; Kaya, Dilek Ozturk
    One way of developing fast effective and high-quality software products is to reuse previously developed software components and products. In the case of a product family the software product line (SPL) approach can make reuse more effective. The goal of SPLs is faster development of low-cost and high-quality software products. This paper proposes an incremental model-based approach to test products in SPLs. The proposed approach utilizes event-based behavioral models of the SPL features. It reuses existing event-based feature models and event-based product models along with their test cases to generate test cases for each new product developed by adding a new feature to an existing product. Newly introduced featured event sequence graphs (FESGs) are used for behavioral feature and product modeling, thus generated test cases are event sequences. The paper presents evaluations with three software product lines to validate the approach and analyze its characteristics by comparing it to the state-of-the-art ESG-based testing approach. Results show that the proposed incremental testing approach highly reuses the existing test sets as intended. Also it is superior to the state-of-the-art approach in terms of fault detection effectiveness and test generation effort but inferior in terms of test set size and test execution effort.
  • Thumbnail Image
    Article
    Citation - WoS: 1
    Citation - Scopus: 4
    Optimized test case generation based on operational profiles with fault-proneness information
    (Springer Verlag service@springer.de, 2015) Tomohiko Takagi; Mutlu Beyazit; Beyazit, Mutlu; Takagi, Tomohiko
    In this paper a novel formal model called an OPFPI (operational profile with fault-proneness information) and a novel algorithm to generate optimized test cases from the OPFPI are proposed in order to effectively improve software reliability or gain a perspective of software reliability in a limited span of time for testing. The OPFPI includes the feasibility problem due to the use of guards (conditions to make specific state transitions feasible), therefore ant colony optimization is employed in the algorithm to generate test cases that cover frequent and fault-prone state transitions as comprehensively as possible. A test tool that implements the OPFPI and executes the optimized test case generation has been developed and it has been applied to a non-trivial system. The obtained results indicate that significant improvement of test cases can be achieved in a short time. © 2015 Elsevier B.V. All rights reserved.
  • Thumbnail Image
    Conference Object
    Citation - WoS: 5
    Featured Event Sequence Graphs for Model-Based Incremental Testing of Software Product Lines
    (IEEE COMPUTER SOC, 2019) Tugkan Tuglular; Mutlu Beyazit; Dilek Ozturk; Beyazit, Mutlu; Tuglular, Tugkan; Ozturk, Dilek; V Getov; JL Gaudiot; N Yamai; S Cimato; M Chang; Y Teranishi; JJ Yang; HV Leong; H Shahriar; M Takemoto; D Towey; H Takakura; A Elci; Susumu; S Puri
    The goal of software product lines (SPLs) is rapid development of high-quality software products in a specific domain with cost minimization. To assure quality of software products from SPLs products need to be tested systematically. However testing every product variant in isolation is generally not feasible for large number of product variants. An approach to deal with this issue is to use incremental testing where test artifacts that are developed for one product are reused for another product which can be obtained by incrementally adding features to the prior product. We propose a novel model-based test generation approach for products developed using SPL that follows incremental testing paradigm. First we introduce Featured Event Sequence Graphs (FESGs) an extension of ESGs that provide necessary definitions and operations to support commonalities and variabilities in SPLs with respect to test models. Then we propose a test generation technique for the product variants of an SPL which starts from any product. The proposed technique with FESGs avoids redundant test generation for each product from SPL. We compare our technique with in-isolation testing approach by a case study.
  • Thumbnail Image
    Article
    Citation - WoS: 7
    Citation - Scopus: 11
    Exploiting Model Morphology for Event-Based Testing
    (IEEE COMPUTER SOC, 2015) Fevzi Belli; Mutlu Beyazit; Belli, Fevzi; Beyazit, Mutlu
    Model-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models called mutants by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k >= 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars related mutation operators and algorithms to generate test cases enabling the following: (1) the exclusion of equivalent mutants and multiple mutants, (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model, (3) the analysis of morphologically different models enabling the systematic generation of mutants thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach.