NANOTRIBOLOGICAL PROPERTIES OF EPITAXIAL GRAPHENE GROWN ON CTERMINATED FACE OF SILICON CARBIDE SEMICONDUCTOR
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Date
2018
Authors
Özhan ÜNVERDİ
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GOLD
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Abstract
The frictional properties of mono-layer and multilayer epitaxial graphene grown on the C terminated face of SiC has beeninvestigated by using atomic force microscopy measurements. Epitaxially grown graphene samples were characterized byRaman spectroscopy measurements. Atomic force microscopy has been employed in ambient conditions for frictionmeasurements using pre-calibrated cantilevers. Both Raman spectroscopy and atomic force microscopy analysis showed thatthe number of defects which increases consistent with increasing number of graphene layers plays an important role on thetribological properties of epitaxial graphene.
Description
Keywords
Nanobilim ve Nanoteknoloji, Friction;Nanotribology;Graphene;SiC;AtomicForce Microscopy.
Fields of Science
0301 basic medicine, 0303 health sciences, 03 medical and health sciences
Citation
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Anadolu Üniversitesi Bilim Ve Teknoloji Dergisi - B Teorik Bilimler
Volume
6
Issue
2
Start Page
1
End Page
1
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